diff options
| author | Carolyn Wyborny <carolyn.wyborny@intel.com> | 2011-02-24 03:12:15 +0000 |
|---|---|---|
| committer | Jeff Kirsher <jeffrey.t.kirsher@intel.com> | 2011-03-03 02:47:59 -0800 |
| commit | 93ed835928f3100c95e0408df0543f35d03f7c23 (patch) | |
| tree | 0980b58c51e7e80c3b7977b5fa76129140b212a9 | |
| parent | 9b082d734a938b951ed4b9b5a850ae3513d4a7e3 (diff) | |
igb: Fix reg pattern test in ethtool for i350 devices
This fixes the reg_pattern_test so that the test does not fail
on i350 parts.
Signed-off-by: Carolyn Wyborny <carolyn.wyborny@intel.com>
Tested-by: Jeff Pieper <jeffrey.e.pieper@intel.com>
Signed-off-by: Jeff Kirsher <jeffrey.t.kirsher@intel.com>
| -rw-r--r-- | drivers/net/igb/igb_ethtool.c | 2 |
1 files changed, 1 insertions, 1 deletions
diff --git a/drivers/net/igb/igb_ethtool.c b/drivers/net/igb/igb_ethtool.c index a70e16bcfa7e..16bbd4922bc3 100644 --- a/drivers/net/igb/igb_ethtool.c +++ b/drivers/net/igb/igb_ethtool.c @@ -1070,7 +1070,7 @@ static bool reg_pattern_test(struct igb_adapter *adapter, u64 *data, {0x5A5A5A5A, 0xA5A5A5A5, 0x00000000, 0xFFFFFFFF}; for (pat = 0; pat < ARRAY_SIZE(_test); pat++) { wr32(reg, (_test[pat] & write)); - val = rd32(reg); + val = rd32(reg) & mask; if (val != (_test[pat] & write & mask)) { dev_err(&adapter->pdev->dev, "pattern test reg %04X " "failed: got 0x%08X expected 0x%08X\n", |