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authorLad, Prabhakar <prabhakar.lad@ti.com>2012-10-01 08:17:36 -0300
committerMauro Carvalho Chehab <mchehab@redhat.com>2012-10-05 21:44:26 -0300
commit5ebef0fbe0f72fa911088800c5d0bc7a872c35de (patch)
tree02b76cf6fc36c613da5a2e7139189f416f656ba9 /Documentation
parentab7ef22419927910e563170db41f0a428d20b0a2 (diff)
[media] media: v4l2-ctrls: add control for test pattern
add V4L2_CID_TEST_PATTERN of type menu, which determines the internal test pattern selected by the device. Signed-off-by: Lad, Prabhakar <prabhakar.lad@ti.com> Signed-off-by: Manjunath Hadli <manjunath.hadli@ti.com> Acked-by: Sakari Ailus <sakari.ailus@iki.fi> Acked-by: Hans Verkuil <hans.verkuil@cisco.com> Signed-off-by: Mauro Carvalho Chehab <mchehab@redhat.com>
Diffstat (limited to 'Documentation')
-rw-r--r--Documentation/DocBook/media/v4l/controls.xml10
1 files changed, 10 insertions, 0 deletions
diff --git a/Documentation/DocBook/media/v4l/controls.xml b/Documentation/DocBook/media/v4l/controls.xml
index 272a5f718509..a84a08ca51dc 100644
--- a/Documentation/DocBook/media/v4l/controls.xml
+++ b/Documentation/DocBook/media/v4l/controls.xml
@@ -4267,6 +4267,16 @@ interface and may change in the future.</para>
pixels / second.
</entry>
</row>
+ <row>
+ <entry spanname="id"><constant>V4L2_CID_TEST_PATTERN</constant></entry>
+ <entry>menu</entry>
+ </row>
+ <row id="v4l2-test-pattern">
+ <entry spanname="descr"> Some capture/display/sensor devices have
+ the capability to generate test pattern images. These hardware
+ specific test patterns can be used to test if a device is working
+ properly.</entry>
+ </row>
<row><entry></entry></row>
</tbody>
</tgroup>