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authorCarolyn Wyborny <carolyn.wyborny@intel.com>2011-02-24 03:12:15 +0000
committerJeff Kirsher <jeffrey.t.kirsher@intel.com>2011-03-03 02:47:59 -0800
commit93ed835928f3100c95e0408df0543f35d03f7c23 (patch)
tree0980b58c51e7e80c3b7977b5fa76129140b212a9 /drivers/net/igb
parent9b082d734a938b951ed4b9b5a850ae3513d4a7e3 (diff)
igb: Fix reg pattern test in ethtool for i350 devices
This fixes the reg_pattern_test so that the test does not fail on i350 parts. Signed-off-by: Carolyn Wyborny <carolyn.wyborny@intel.com> Tested-by: Jeff Pieper <jeffrey.e.pieper@intel.com> Signed-off-by: Jeff Kirsher <jeffrey.t.kirsher@intel.com>
Diffstat (limited to 'drivers/net/igb')
-rw-r--r--drivers/net/igb/igb_ethtool.c2
1 files changed, 1 insertions, 1 deletions
diff --git a/drivers/net/igb/igb_ethtool.c b/drivers/net/igb/igb_ethtool.c
index a70e16bcfa7e..16bbd4922bc3 100644
--- a/drivers/net/igb/igb_ethtool.c
+++ b/drivers/net/igb/igb_ethtool.c
@@ -1070,7 +1070,7 @@ static bool reg_pattern_test(struct igb_adapter *adapter, u64 *data,
{0x5A5A5A5A, 0xA5A5A5A5, 0x00000000, 0xFFFFFFFF};
for (pat = 0; pat < ARRAY_SIZE(_test); pat++) {
wr32(reg, (_test[pat] & write));
- val = rd32(reg);
+ val = rd32(reg) & mask;
if (val != (_test[pat] & write & mask)) {
dev_err(&adapter->pdev->dev, "pattern test reg %04X "
"failed: got 0x%08X expected 0x%08X\n",