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authorLi Jun <B47624@freescale.com>2014-09-27 19:43:08 +0800
committerNitin Garg <nitin.garg@nxp.com>2016-01-14 10:59:13 -0600
commit7e9ea97eceb71fd994615da8431adee2041dd98f (patch)
treede01001eeb568fa6ebdb414f8622112a2195ff50 /include/uapi
parentf82574b6983bd21b6947cc44619121130d1301cc (diff)
MLK-9637-1 usb: test: define otg_srp_reqd wIndex byte value
This patch adds otg_srp_reqd wIndex high byte value for otg test mode. Acked-by: Peter Chen <peter.chen@freescale.com> Signed-off-by: Li Jun <b47624@freescale.com> (cherry picked from commit 34660f7aa14972630622406b9dbfc7a106d8d15d) (cherry picked from commit c5128f9bafaa37a8e63989032372a5ff36dc82c4)
Diffstat (limited to 'include/uapi')
-rw-r--r--include/uapi/linux/usb/ch9.h1
1 files changed, 1 insertions, 0 deletions
diff --git a/include/uapi/linux/usb/ch9.h b/include/uapi/linux/usb/ch9.h
index f7adc6e01f9e..a76720312739 100644
--- a/include/uapi/linux/usb/ch9.h
+++ b/include/uapi/linux/usb/ch9.h
@@ -135,6 +135,7 @@
#define TEST_SE0_NAK 3
#define TEST_PACKET 4
#define TEST_FORCE_EN 5
+#define TEST_OTG_SRP_REQD 6
/*
* New Feature Selectors as added by USB 3.0