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author | Masahiro Yamada <yamada.m@jp.panasonic.com> | 2014-12-26 22:20:57 +0900 |
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committer | Stefan Agner <stefan@agner.ch> | 2015-04-01 09:01:33 +0200 |
commit | eed5255d6cca9afc6f90d770c40256ff3a0ee117 (patch) | |
tree | 8763f4f02025d548611881faae80f9679244bc56 /board/cpc45 | |
parent | 26d64d613123c4b2ebf496d317561ce54675e16a (diff) |
mtd: nand: Mark the BBT as scanned prior to calling scan_bbt again
Commit 35c204d8a9d0 (nand: reinstate lazy bad block scanning)
broke NAND_BBT_USE_FLASH feature.
Its git-log claimed that it reinstated the change as by commit
fb49454b1b6c ("nand: reinstate lazy bad block scanning"), but it moved
"chip->options |= NAND_BBT_SCANNED" below "chip->scan_bbt(mtd);".
It causes recursion if scan_bbt does not find a flash based BBT
and tries to write one, and the attempt to erase the BBT area
causes a bad block check.
Reinstate commit ff49ea8977b5 (NAND: Mark the BBT as scanned prior to
calling scan_bbt.).
Signed-off-by: Masahiro Yamada <yamada.m@jp.panasonic.com>
Cc: Rostislav Lisovy <lisovy@merica.cz>
Cc: Heiko Schocher <hs@denx.de>
Cc: Scott Wood <scottwood@freescale.com>
Diffstat (limited to 'board/cpc45')
0 files changed, 0 insertions, 0 deletions