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authorSimon Glass <sjg@chromium.org>2014-07-23 06:55:18 -0600
committerSimon Glass <sjg@chromium.org>2014-07-23 14:08:36 +0100
commit1ca7e2062b4e8c3b211753dcb19c063b5b9b73ca (patch)
tree09873667a133ba84aed32e5b44cfcd08353d1138 /doc/driver-model
parent0040b9442947d00a540f6e93742384a14453c37e (diff)
dm: Provide a function to scan child FDT nodes
At present only root nodes in the device tree are scanned for devices. But some devices can have children. For example a SPI bus may have several children for each of its chip selects. Add a function which scans subnodes and binds devices for each one. This can be used for the root node scan also, so change it. A device can call this function in its bind() or probe() methods to bind its children. Signed-off-by: Simon Glass <sjg@chromium.org>
Diffstat (limited to 'doc/driver-model')
-rw-r--r--doc/driver-model/README.txt6
1 files changed, 5 insertions, 1 deletions
diff --git a/doc/driver-model/README.txt b/doc/driver-model/README.txt
index 672497d482..a2b6122ebc 100644
--- a/doc/driver-model/README.txt
+++ b/doc/driver-model/README.txt
@@ -95,9 +95,13 @@ are provided in test/dm. To run them, try:
You should see something like this:
<...U-Boot banner...>
- Running 17 driver model tests
+ Running 18 driver model tests
Test: dm_test_autobind
Test: dm_test_autoprobe
+ Test: dm_test_bus_children
+ Device 'd-test': seq 3 is in use by 'b-test'
+ Device 'c-test@0': seq 0 is in use by 'a-test'
+ Device 'c-test@1': seq 1 is in use by 'd-test'
Test: dm_test_children
Test: dm_test_fdt
Device 'd-test': seq 3 is in use by 'b-test'