diff options
| author | Stephen Warren <swarren@nvidia.com> | 2016-01-27 23:57:46 -0700 |
|---|---|---|
| committer | Simon Glass <sjg@chromium.org> | 2016-01-28 21:01:24 -0700 |
| commit | 26e1beccbeb82ce7a4713ad899eb34b795228891 (patch) | |
| tree | 8bcbfeb8acc6eb186a52e1967d965df58bbcc894 /test | |
| parent | d20e5e976f70bd2e230787091a88278dfe6e5192 (diff) | |
test/dm: clear unit test failure count each run
The ut command prints a test failure count each time it is executed.
This is stored in a global variable which is never reset. Consequently,
the printed failure count accumulates across runs. Fix this by clearing
the counter each time "ut" is invoked.
Signed-off-by: Stephen Warren <swarren@nvidia.com>
Acked-by: Simon Glass <sjg@chromium.org>
Diffstat (limited to 'test')
| -rw-r--r-- | test/dm/test-main.c | 2 |
1 files changed, 2 insertions, 0 deletions
diff --git a/test/dm/test-main.c b/test/dm/test-main.c index 91bdda83ab3..f2e00481438 100644 --- a/test/dm/test-main.c +++ b/test/dm/test-main.c @@ -81,6 +81,8 @@ static int dm_test_main(const char *test_name) struct unit_test *test; int run_count; + uts->fail_count = 0; + /* * If we have no device tree, or it only has a root node, then these * tests clearly aren't going to work... |