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Diffstat (limited to 'test/dm/sf.c')
-rw-r--r-- | test/dm/sf.c | 43 |
1 files changed, 43 insertions, 0 deletions
diff --git a/test/dm/sf.c b/test/dm/sf.c new file mode 100644 index 00000000000..57dd1345c43 --- /dev/null +++ b/test/dm/sf.c @@ -0,0 +1,43 @@ +/* + * Copyright (C) 2013 Google, Inc + * + * SPDX-License-Identifier: GPL-2.0+ + */ + +#include <common.h> +#include <dm.h> +#include <fdtdec.h> +#include <spi.h> +#include <spi_flash.h> +#include <asm/state.h> +#include <dm/ut.h> +#include <dm/test.h> +#include <dm/util.h> + +/* Test that sandbox SPI flash works correctly */ +static int dm_test_spi_flash(struct dm_test_state *dms) +{ + /* + * Create an empty test file and run the SPI flash tests. This is a + * long way from being a unit test, but it does test SPI device and + * emulator binding, probing, the SPI flash emulator including + * device tree decoding, plus the file-based backing store of SPI. + * + * More targeted tests could be created to perform the above steps + * one at a time. This might not increase test coverage much, but + * it would make bugs easier to find. It's not clear whether the + * benefit is worth the extra complexity. + */ + ut_asserteq(0, run_command_list( + "sb save hostfs - spi.bin 0 200000;" + "sf probe;" + "sf test 0 10000", -1, 0)); + /* + * Since we are about to destroy all devices, we must tell sandbox + * to forget the emulation device + */ + sandbox_sf_unbind_emul(state_get_current(), 0, 0); + + return 0; +} +DM_TEST(dm_test_spi_flash, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT); |