diff options
| author | Simon Glass <sjg@chromium.org> | 2024-08-22 07:57:48 -0600 |
|---|---|---|
| committer | Tom Rini <trini@konsulko.com> | 2024-08-26 18:51:48 -0600 |
| commit | 725c438c6271f1870636f61a68d6904dc27a1357 (patch) | |
| tree | ea7305492e3b2c4c8e4887eabe7e7e273e7c8f55 /test/dm/acpigen.c | |
| parent | 88ae69f3b7efaa8de5c9d5d50081d6bf83e77ae9 (diff) | |
test: Rename unit-test flags
The UT_TESTF_ macros read as 'unit test test flags' which is not right.
Rename to UTF ('unit test flags').
This has the benefit of being shorter, which helps keep UNIT_TEST()
declarations on a single line.
Give the enum a name and reference it from the UNIT_TEST() macros while
we are here.
Signed-off-by: Simon Glass <sjg@chromium.org>
Diffstat (limited to 'test/dm/acpigen.c')
| -rw-r--r-- | test/dm/acpigen.c | 19 |
1 files changed, 9 insertions, 10 deletions
diff --git a/test/dm/acpigen.c b/test/dm/acpigen.c index 7113219792e..3e912fadaef 100644 --- a/test/dm/acpigen.c +++ b/test/dm/acpigen.c @@ -167,7 +167,7 @@ static int dm_test_acpi_interrupt(struct unit_test_state *uts) return 0; } -DM_TEST(dm_test_acpi_interrupt, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT); +DM_TEST(dm_test_acpi_interrupt, UTF_SCAN_PDATA | UTF_SCAN_FDT); /* Test emitting a GPIO descriptor */ static int dm_test_acpi_gpio(struct unit_test_state *uts) @@ -212,7 +212,7 @@ static int dm_test_acpi_gpio(struct unit_test_state *uts) return 0; } -DM_TEST(dm_test_acpi_gpio, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT); +DM_TEST(dm_test_acpi_gpio, UTF_SCAN_PDATA | UTF_SCAN_FDT); /* Test emitting a GPIO descriptor with an interrupt */ static int dm_test_acpi_gpio_irq(struct unit_test_state *uts) @@ -257,7 +257,7 @@ static int dm_test_acpi_gpio_irq(struct unit_test_state *uts) return 0; } -DM_TEST(dm_test_acpi_gpio_irq, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT); +DM_TEST(dm_test_acpi_gpio_irq, UTF_SCAN_PDATA | UTF_SCAN_FDT); /* Test emitting either a GPIO or interrupt descriptor */ static int dm_test_acpi_interrupt_or_gpio(struct unit_test_state *uts) @@ -296,8 +296,7 @@ static int dm_test_acpi_interrupt_or_gpio(struct unit_test_state *uts) return 0; } -DM_TEST(dm_test_acpi_interrupt_or_gpio, - UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT); +DM_TEST(dm_test_acpi_interrupt_or_gpio, UTF_SCAN_PDATA | UTF_SCAN_FDT); /* Test emitting an I2C descriptor */ static int dm_test_acpi_i2c(struct unit_test_state *uts) @@ -329,7 +328,7 @@ static int dm_test_acpi_i2c(struct unit_test_state *uts) return 0; } -DM_TEST(dm_test_acpi_i2c, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT); +DM_TEST(dm_test_acpi_i2c, UTF_SCAN_PDATA | UTF_SCAN_FDT); /* Test emitting a SPI descriptor */ static int dm_test_acpi_spi(struct unit_test_state *uts) @@ -365,7 +364,7 @@ static int dm_test_acpi_spi(struct unit_test_state *uts) return 0; } -DM_TEST(dm_test_acpi_spi, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT); +DM_TEST(dm_test_acpi_spi, UTF_SCAN_PDATA | UTF_SCAN_FDT); /* Test emitting a length */ static int dm_test_acpi_len(struct unit_test_state *uts) @@ -806,7 +805,7 @@ static int dm_test_acpi_gpio_toggle(struct unit_test_state *uts) return 0; } -DM_TEST(dm_test_acpi_gpio_toggle, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT); +DM_TEST(dm_test_acpi_gpio_toggle, UTF_SCAN_PDATA | UTF_SCAN_FDT); /* Test writing ACPI code to output power-sequence info */ static int dm_test_acpi_power_seq(struct unit_test_state *uts) @@ -873,7 +872,7 @@ static int dm_test_acpi_power_seq(struct unit_test_state *uts) return 0; } -DM_TEST(dm_test_acpi_power_seq, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT); +DM_TEST(dm_test_acpi_power_seq, UTF_SCAN_PDATA | UTF_SCAN_FDT); /* Test writing values */ static int dm_test_acpi_write_values(struct unit_test_state *uts) @@ -947,7 +946,7 @@ static int dm_test_acpi_scope(struct unit_test_state *uts) return 0; } -DM_TEST(dm_test_acpi_scope, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT); +DM_TEST(dm_test_acpi_scope, UTF_SCAN_PDATA | UTF_SCAN_FDT); /* Test writing a resource template */ static int dm_test_acpi_resource_template(struct unit_test_state *uts) |