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authorTom Rini <trini@konsulko.com>2024-08-26 18:52:18 -0600
committerTom Rini <trini@konsulko.com>2024-08-26 18:52:18 -0600
commit9735cfaf904551759597067d76e2ae2ec21d582a (patch)
tree5578133191f3a0557deb2360e14eb367fab804b9 /test/dm/i2c.c
parent02d587a447ccae12618abbfb2b8ddd88ac3c7648 (diff)
parent695b4645325ef40c792a6e6a3849d134fcf80ed0 (diff)
Merge patch series "Tidy up console recording in tests"
Simon Glass <sjg@chromium.org> says: This series started as a small fix for checking for an empty line, but in the process several other problems were found and fixed: - fix tests which use console recording but don't set the flag - drop unnecessary resetting of the console in tests - drop unnecessary blank line before MMC output - update the docs a little - fix buildman test failure on newer Pythons - a few other minor things This series also renames the confusing flag names, so that they are easier to remember - just a UTF_ (unit-test flags) prefix.
Diffstat (limited to 'test/dm/i2c.c')
-rw-r--r--test/dm/i2c.c19
1 files changed, 9 insertions, 10 deletions
diff --git a/test/dm/i2c.c b/test/dm/i2c.c
index e9cf9f7819a..40f1f26b671 100644
--- a/test/dm/i2c.c
+++ b/test/dm/i2c.c
@@ -38,7 +38,7 @@ static int dm_test_i2c_find(struct unit_test_state *uts)
return 0;
}
-DM_TEST(dm_test_i2c_find, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
+DM_TEST(dm_test_i2c_find, UTF_SCAN_PDATA | UTF_SCAN_FDT);
static int dm_test_i2c_read_write(struct unit_test_state *uts)
{
@@ -55,7 +55,7 @@ static int dm_test_i2c_read_write(struct unit_test_state *uts)
return 0;
}
-DM_TEST(dm_test_i2c_read_write, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
+DM_TEST(dm_test_i2c_read_write, UTF_SCAN_PDATA | UTF_SCAN_FDT);
static int dm_test_i2c_speed(struct unit_test_state *uts)
{
@@ -77,7 +77,7 @@ static int dm_test_i2c_speed(struct unit_test_state *uts)
return 0;
}
-DM_TEST(dm_test_i2c_speed, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
+DM_TEST(dm_test_i2c_speed, UTF_SCAN_PDATA | UTF_SCAN_FDT);
static int dm_test_i2c_offset_len(struct unit_test_state *uts)
{
@@ -94,7 +94,7 @@ static int dm_test_i2c_offset_len(struct unit_test_state *uts)
return 0;
}
-DM_TEST(dm_test_i2c_offset_len, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
+DM_TEST(dm_test_i2c_offset_len, UTF_SCAN_PDATA | UTF_SCAN_FDT);
static int dm_test_i2c_probe_empty(struct unit_test_state *uts)
{
@@ -109,7 +109,7 @@ static int dm_test_i2c_probe_empty(struct unit_test_state *uts)
return 0;
}
-DM_TEST(dm_test_i2c_probe_empty, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
+DM_TEST(dm_test_i2c_probe_empty, UTF_SCAN_PDATA | UTF_SCAN_FDT);
static int dm_test_i2c_bytewise(struct unit_test_state *uts)
{
@@ -164,7 +164,7 @@ static int dm_test_i2c_bytewise(struct unit_test_state *uts)
return 0;
}
-DM_TEST(dm_test_i2c_bytewise, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
+DM_TEST(dm_test_i2c_bytewise, UTF_SCAN_PDATA | UTF_SCAN_FDT);
static int dm_test_i2c_offset(struct unit_test_state *uts)
{
@@ -237,7 +237,7 @@ static int dm_test_i2c_offset(struct unit_test_state *uts)
return 0;
}
-DM_TEST(dm_test_i2c_offset, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
+DM_TEST(dm_test_i2c_offset, UTF_SCAN_PDATA | UTF_SCAN_FDT);
static int dm_test_i2c_addr_offset(struct unit_test_state *uts)
{
@@ -301,8 +301,7 @@ static int dm_test_i2c_addr_offset(struct unit_test_state *uts)
return 0;
}
-
-DM_TEST(dm_test_i2c_addr_offset, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
+DM_TEST(dm_test_i2c_addr_offset, UTF_SCAN_PDATA | UTF_SCAN_FDT);
static int dm_test_i2c_reg_clrset(struct unit_test_state *uts)
{
@@ -331,4 +330,4 @@ static int dm_test_i2c_reg_clrset(struct unit_test_state *uts)
return 0;
}
-DM_TEST(dm_test_i2c_reg_clrset, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
+DM_TEST(dm_test_i2c_reg_clrset, UTF_SCAN_PDATA | UTF_SCAN_FDT);