diff options
| author | Simon Glass <sjg@chromium.org> | 2024-08-22 07:57:48 -0600 |
|---|---|---|
| committer | Tom Rini <trini@konsulko.com> | 2024-08-26 18:51:48 -0600 |
| commit | 725c438c6271f1870636f61a68d6904dc27a1357 (patch) | |
| tree | ea7305492e3b2c4c8e4887eabe7e7e273e7c8f55 /test/dm/of_platdata.c | |
| parent | 88ae69f3b7efaa8de5c9d5d50081d6bf83e77ae9 (diff) | |
test: Rename unit-test flags
The UT_TESTF_ macros read as 'unit test test flags' which is not right.
Rename to UTF ('unit test flags').
This has the benefit of being shorter, which helps keep UNIT_TEST()
declarations on a single line.
Give the enum a name and reference it from the UNIT_TEST() macros while
we are here.
Signed-off-by: Simon Glass <sjg@chromium.org>
Diffstat (limited to 'test/dm/of_platdata.c')
| -rw-r--r-- | test/dm/of_platdata.c | 16 |
1 files changed, 8 insertions, 8 deletions
diff --git a/test/dm/of_platdata.c b/test/dm/of_platdata.c index d4939e88516..6e35bcaf62c 100644 --- a/test/dm/of_platdata.c +++ b/test/dm/of_platdata.c @@ -20,7 +20,7 @@ static int dm_test_of_plat_base(struct unit_test_state *uts) return 0; } -DM_TEST(dm_test_of_plat_base, UT_TESTF_SCAN_PDATA); +DM_TEST(dm_test_of_plat_base, UTF_SCAN_PDATA); /* Test that we can read properties from a device */ static int dm_test_of_plat_props(struct unit_test_state *uts) @@ -91,7 +91,7 @@ static int dm_test_of_plat_props(struct unit_test_state *uts) return 0; } -DM_TEST(dm_test_of_plat_props, UT_TESTF_SCAN_PDATA); +DM_TEST(dm_test_of_plat_props, UTF_SCAN_PDATA); /* * find_driver_info - recursively find the driver_info for a device @@ -173,7 +173,7 @@ static int dm_test_of_plat_dev(struct unit_test_state *uts) return 0; } -DM_TEST(dm_test_of_plat_dev, UT_TESTF_SCAN_PDATA); +DM_TEST(dm_test_of_plat_dev, UTF_SCAN_PDATA); /* Test handling of phandles that point to other devices */ static int dm_test_of_plat_phandle(struct unit_test_state *uts) @@ -206,7 +206,7 @@ static int dm_test_of_plat_phandle(struct unit_test_state *uts) return 0; } -DM_TEST(dm_test_of_plat_phandle, UT_TESTF_SCAN_PDATA); +DM_TEST(dm_test_of_plat_phandle, UTF_SCAN_PDATA); #if CONFIG_IS_ENABLED(OF_PLATDATA_PARENT) /* Test that device parents are correctly set up */ @@ -220,7 +220,7 @@ static int dm_test_of_plat_parent(struct unit_test_state *uts) return 0; } -DM_TEST(dm_test_of_plat_parent, UT_TESTF_SCAN_PDATA); +DM_TEST(dm_test_of_plat_parent, UTF_SCAN_PDATA); #endif /* Test clocks with of-platdata */ @@ -239,7 +239,7 @@ static int dm_test_of_plat_clk(struct unit_test_state *uts) return 0; } -DM_TEST(dm_test_of_plat_clk, UT_TESTF_SCAN_PDATA); +DM_TEST(dm_test_of_plat_clk, UTF_SCAN_PDATA); /* Test irqs with of-platdata */ static int dm_test_of_plat_irq(struct unit_test_state *uts) @@ -258,7 +258,7 @@ static int dm_test_of_plat_irq(struct unit_test_state *uts) return 0; } -DM_TEST(dm_test_of_plat_irq, UT_TESTF_SCAN_PDATA); +DM_TEST(dm_test_of_plat_irq, UTF_SCAN_PDATA); /* Test GPIOs with of-platdata */ static int dm_test_of_plat_gpio(struct unit_test_state *uts) @@ -277,4 +277,4 @@ static int dm_test_of_plat_gpio(struct unit_test_state *uts) return 0; } -DM_TEST(dm_test_of_plat_gpio, UT_TESTF_SCAN_PDATA); +DM_TEST(dm_test_of_plat_gpio, UTF_SCAN_PDATA); |